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Materials Science Laboratory

Building for Experimental Physics: Building 308 Facultad de Fisica, P. Univ. Catolica de Chile, located at Campus San Joaquin, Vicuna Mackenna 4860, Macul, Santiago

How to get here:Take line 5 of Metro (subway) and get off at Campus San Joaquin station

The research of Prof. Alejandro L. Cabrera is strongly oriented towards the study of thin films and their surface properties. Therefore, Prof. Cabrera's laboratories within the Material Science Laboratory are equipped to carry out such a work. There are several main pieces of equipment located in the Experimental Physics building.

Equipment for Research

UHV for Thermal Programmed Desorption

An ultra-high vacuum system which incorporates a 50 l/s Turbo pump and SRS 100 RGA mass spectrometer (100 AMU), a Perkin-Elmer argon sputtering gun and a custom made sample manipulator. The samples in the shape of foils 1×1 cm can be heated up to 1000 degrees C by a high current AC power supply. The base pressure of this system is around 5×10-9 Torr. This system can be used to obtain change of resistance measurements for films exposed to gases but the chamber is small.

UHV System with Auger Electron Spectroscopy

UHV chamber with vibration isolation from the pumping system by means of legs used in optical benchs was implemented. A combination pumping of Turbopump and Ion pump achieving base pressure of 1×10-9 Torr. The system was fitted with a DESA 100 Electron Spectrometer. Funds were obtained from Pontificia Universidad Catolica and MECESUP 2002.

auger1.jpg auger2.jpg

Thin Films Evaporator

Edwars bench top, turbo pump-operated high vacuum evaporator for deposition of metal films. This system incorporated e-beam system and power supply for PVD evaporation, a shutter system, rotary fixture, steel jar and quartz crystal monitor. Funds obtained from UNDP, 1990 and Fundacion Andes 1997.

Cahn Microbalance

A Cahn 2000 micro balance system with furnace and accessories. This system can be used to obtain surface area and adsorption kinetic data by means of gravimetric measurements. Thermogravimetric data can be collected from the desorption of gas from powder materials. The system can be used for oxidation studies of metals and to monitor film deposition on solid substrates. This system is presently being used in several research projects for magnetic measurements of thin films exposed to gases . Funds obtained from Fundacion Andes, 1990.

Equipment for Research and Service

Secondary Electron Microscope (SEM)

Scanning Electron Microscopy (SEM) with Energy Dispersive Spectroscopy (EDS)

LEO VP1400 system equipped with energy dispersive spectroscopy (Oxford). Microscopic images are obtained by operating the SEM at an accelerating voltage of 25 kV and using secondary and back-scattered electrons detectors. When requesting service, write to acabrera@fis.puc.cl or visit http://servicios.fis.puc.cl/sem/

X-Ray Difraction

X-ray diffraction patterns of powder material or thin films can be taken at room temperature with a Bruker D-8 Advanced Diffractometer, equipped with an x-ray tube-copper anode (λ(CuKα) = 0.154 nm). The diffraction patterns can be obtained in the usual θ-θ or θ-2θ geometry. The X-ray tube is operated at 40 kV and 40 mA. The goniometer can be swept between 1º and 160º at 0.02 º/s over the whole 2θ interval. The diffracted X-rays are detected with a scintillation detector. When requesting service, write to acabrera@fis.puc.cl or visit http://servicios.fis.puc.cl/rayosx/

Micro-Raman System

Visible Light Raman Spectrometer with microscope attachment, LabRam 010 with scanning option from Instruments S.A. Funds obtained from FONDEF, 1998 and Fundacion Andes 1997.When requesting service, write to acabrera@fis.puc.cl or visit http://servicios.fis.puc.cl/raman/

raman.jpg LEAD Technologies Inc. V1.01

Surface Area Measurements (BET technique)

Quantasorb System A Quantasorb dynamic flow gas sorption system. This equipment allows single or multipoint surface area analysis, adsorption and desorption isotherms, pore volume and pore size distribution. The system can be used to characterize roughness of films. The system is used to study adsorption of CO2 in several ferroelectric powder samples. Funds obtained from Fundacion Andes, 1990

lab/start.txt · Last modified: 2014/06/17 09:33 (external edit)